Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point

LI Gang; WANG Pengjun; QIAN Haoyu

doi:10.1049/cje.2018.02.011

Volume 27 Issue 4

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LI Gang, WANG Pengjun, QIAN Haoyu, “Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point,” Chinese Journal of Electronics, vol. 27, no. 4, pp. 873-878, 2018, doi: 10.1049/cje.2018.02.011

Citation:

LI Gang, WANG Pengjun, QIAN Haoyu, “Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point,” Chinese Journal of Electronics, vol. 27, no. 4, pp. 873-878, 2018, doi: 10.1049/cje.2018.02.011

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Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point

doi: 10.1049/cje.2018.02.011

Institute of Circuits and Systems, Ningbo University, Ningbo 315211, China

Funds: This work is supported by the National Natural Science Foundation of China (No.61474068, No.61274132), the Natural Science Foundation of Zhejiang Provice (No.LQ14F040001), the Project of Department of Education of Zhejiang Provice (No.Y201430798), and the Scientific Research Foundation of Graduate School of Ningbo University and the K.C. Wong Magna Fund in Ningbo University, China.

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Corresponding author: WANG Pengjun (corresponding author) was born in 1966. He received the M.S. degree in electronic science and technology from Zhejiang University, and the Ph.D. degree in detection technology and automatic equipment from East China University of Science and Technology. He is a professor in the Institute of Circuits and Systems at Ningbo University. He is now a senior member of Chinese Institute of Electronics and Chinese Computer Federation. His research interests include multi-valued logic circuit, low power integrated circuit design and information security chip design. (Email:wangpengjun@nbu.edu.cn)
Received Date: 2016-03-08
Rev Recd Date: 2016-05-27
Publish Date: 2018-07-10

Abstract

Abstract

By using processing variations in the unitcircuits of the same structures and design parameters during manufacturing, Physical unclonable function (PUF) generates security keys with characteristic of uniqueness, randomness and unclonability. In this paper, a highly reliable multiport PUF scheme was proposed based on MOSFET Zero temperature coefficient (ZTC) point. It consists of input register, deviation-current generating module, arbiter array and obfuscation circuit. After reconfiguring deviation-current generating module by applying different input challenges, the PUF circuit updates keys without physical replacement. And multi-bit keys can be generated in one clock cycle. In TSMC-LP 65nm CMOS technology, the layout of 64-port reconfigurable PUF occupies 131μm×242μm with custom designing. Experimental results show that the PUF circuit has good statistical characteristic of uniqueness and randomness. It exhibits high reliability of 98.2% with respect to temperature variation from -40℃ to 125℃ and supply voltage variation from 1.08V to 1.32V, indicating that it can be reliably and effectively used in information security field.
- Physical unclonable function (PUF),
- Zero temperature coefficient (ZTC),
- Multiport,
- Circuit design

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References(19)

References

M. Potkonjak and V. Goudar, "Public physical unclonable functions", Proceedings of the IEEE, Vol.102, No.8, pp.1142-1156, 2014.

P.J. Wang, X.L. Zhang and Y.J Zhang, "Design of robust PUF based on the optimal gate voltage", Acta Electronic Sinica, Vol.43, No.5, pp.907-910, 2015. (in Chinese)

G.E. Suh and S. Devadas, "Physical unclonable functions for device authentication and secret key generation", Proc. DAC., San Francisco, USA, pp.9-14, 2007.

J. Zhang, Y. Lin, Y. Lyu, et al., "A PUF-FSM binding scheme for FPGA IP protection and pay-per-device licensing", IEEE Transactions on Information Forensics and Security, Vol.10, No.6, pp.1137-1150, 2015.

C. Bosch, J. Guajardo, A. Sadeghi, et al., "Efficient helper data key extractor on FPGAs", Proc. CHES., Washington, USA, pp.181-197, 2008.

H. Kang, Y. Hori, T. Katashita, et al., "Cryptographic key generation from PUF data using efficient fuzzy extractors", Proc. ICACT, Pyeong-Chang, Korea, pp.23-26, 2014.

M. Bhargava and K. Mai, "An efficient reliable PUF-based cryptographic key generator in 65nm CMOS", Proc. DATE., Dresden, Germany, pp.1-6, 2014.

Y. Wang, Z. Zhu, J. Yao, et al., "A 0.45-V, 14.6-nW CMOS subthreshold voltage reference with no resistors and no BJTs", IEEE Transactions On Circuits and SystemsⅡ:Express Briefs, Vol.62, No.7, pp.621-625, 2015.

A. Amaravati, M. Dave, M.S. Baghini, et al., "800-nA processand-voltage-invariant 106-dB PSRR PTAT current reference", IEEE Transactions On Circuits and SystemsⅡ:Express Briefs, Vol.60, No.9, pp.577-581, 2013.

A. Bendali and Y. Audet, "A 1-V CMOS current reference with temperature and process compensation", IEEE Transactions on Circuits and SystemsCI:Regular Papers, Vol.54, No.7, pp.1424-1429, 2007.

A. Maiti and P. Schaumont, "Improved ring oscillator PUF:An FPGA-friendly secure primitive", Journal of cryptology, Vol.24, pp.375-397, 2011.

Y. Lao and K.K. Parhi, "Statistical analysis of MUXbased physical unclonable functions", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.33, No.5, pp.649-662, 2014.

R. Maes, Physically unclonable functions:Constructions, properties and applications, Springer, Berlin Heidelberg, Germany, pp.31-34,105-114, 2013.

C. Bai, X. Zou and K. Dai, "A novel thyristor-based silicon physical unclonable function", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.24, No.1, pp.290-300, 2016.

Y. Su, J. Holleman and B.P. Otis, "A digital 1.6 pJ/bit chip identification circuit using process variations", IEEE Transactions on Information Forensics and Security, Vol.41, No.3, pp.69-77, 2008.

Y. Cao, L. Zhang and C.H. Chang, "A low-power hybrid RO PUF with improved thermal stability for lightweight applications", IEEE Transactions on Computer-Aided Design of Integrated circuits and systems, Vol.34, No.7, pp.1143-1147, 2015.

D. Ganta, V. Vivekraja, K. Priya, et al., "A highly stable leakage-based silicon physical unclonable functions", Proc. IEEE VLSI., Madras, India, pp.135-140, 2011.

M. Kalyanaraman and M. Orshansky, "Novel Strong PUF based on Nonlinearity of MOSFET Subthreshold Operation", Proc. IEEE HOST., Austin, USA, pp.13-18, 2013.

R. Kumar and W. Burleson, "On design of a highly secure PUF based on non-linear current mirrors", Proc. IEEE HOST., Washington, USA, pp.38-43, 2014.

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