HUANG Liang, HOU Jianjun, LIU Ying, et al., “Grey Entropy Relation Algorithm of Choosing the Optimum Diagnostic Nodes in Analogue Circuits,” Chinese Journal of Electronics, vol. 22, no. 3, pp. 615-620, 2013,
Citation: HUANG Liang, HOU Jianjun, LIU Ying, et al., “Grey Entropy Relation Algorithm of Choosing the Optimum Diagnostic Nodes in Analogue Circuits,” Chinese Journal of Electronics, vol. 22, no. 3, pp. 615-620, 2013,

Grey Entropy Relation Algorithm of Choosing the Optimum Diagnostic Nodes in Analogue Circuits

Funds:  This work is supported by the National Natural Science Foundation of China (No.61172130) and the Fundamental Research Funds for the Central Universities (No.2013JBM016, No.2012JBM022).
  • Received Date: 2012-09-01
  • Rev Recd Date: 2013-01-01
  • Publish Date: 2013-06-15
  • Choosing the optimum diagnostic nodes is helpful to increase the accuracy and the efficiency of circuits fault diagnosis. Grey entropy relation algorithm is proposed to choose the optimum diagnostic nodes of analogue circuits in this paper. Analogue circuits are regarded as grey system. Grey relation analysis and grey entropy analysis are combined to grey entropy relation algorithm. Grey entropy relation algorithm is used to quantify the relationship between the diagnostic nodes and fault components. The relevance between the diagnostic nodes and fault components can be evaluated by grey entropy relation degrees. According to the rank order of grey entropy relation degrees, the optimum diagnostic nodes of analogue circuits can be selected objectively and accurately. An example of fault diagnosis is presented to verify the validity of the optimum diagnostic nodes.
  • loading
  • Yanghong Tan, Yigang He and JieWu, “Neural network method of fault diagnosis for large-scale analogue circuits”, Chinese Journal of Electronics, Vol.12, No.1, pp.57-60, 2003.
    Daqi Zhu and Shenglin Yu, “Data fusion algorithm based on D-S evidential theory and its application for circuit fault diagnosis”, Acta Electronica Sinica, Vol.30, No.2, pp.221-223, 2002. (in Chinese)
    V.C. Prasad and N. Sarat Chandra Babu, “Selection of test nodes for analog fault diagnosis in dictionary approach”, IEEE Transactions on Instrumentation and Measurement, Vol.49, No.6, pp.1289-1297, 2000.
    Feng Li and Pengyung Woo, “The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method”, IEEE Transactions on Circuits and Systems ??: Fundamental Theory and Applications, Vol.46, No.10, pp.1222-1227, 1999.
    Longfu Zhou, Yonghe Hu, Ming Zhao et al., “A selection strategy of test node in analogy circuit with sensitivity”, Journal of Communication and Computer, Vol.8, No.10, pp.895-898, 2011.
    Rong Zhang, Bin Liu, Ye Li and Fenyi Dong, “A new computation model of grey relational degree”, Journal of Grey System, Vol.23, No.3, pp.161-168, 2011.
    Chanyun Yang and Juijen Chou, “Entropy on grey relational analysis”, Journal of Grey System, Vol.14, No.4, pp.313-320, 2001.
    Liang Huang, Jianjun Hou and Yong Guo, “Analog circuits can be regarded as grey system to diagnose fault”, IEEE International Conference on Broadband Network and Multimedia Technology, Beijing, China, pp.1172-1175, 2010.
    Julong Deng, “Introduction of grey system theory”, Journal of Grey System, Vol.1, No.1, pp.1-24, 1989.
    Feng Lu, “Research on the Identification Coefficient of Relational Grade for Grey System”, System Engineering Theory and Practice, Vol.17, No.6, pp.49-54, 1997.
    B.D.Mott, C.P. Natoli, C.M. Feuerstein et al., “Sensing RF connector tightness using a grounded plate capacitive structure”, IEEE Sensors Journal, Vol.8, No.11, pp.1887-1893, 2008.
    A. Braham, A. Lahyani, P. Venet and N. Rejeb, “Recent developments in fault detection and power loss estimation of electrolytic capacitors”, IEEE Transactions on Power Electronics, Vol.25, No.1, pp.33-43, 2010.
    D. Selkirk, M. Savostianik and K. Crawford, “The dangers of grounding resistor failure”, IEEE Industry Applications Magazine,Vol.16, No.5, pp.53-58, 2010.
    Shengjian Chen, Bingrong Hong, Yuefang Wang, Zhiyong Shi and Yunhua Huang, “A new fault dictionary method enable to diagnose soft fault of tolerance analog circuits”, Acta Electronica Sinica, Vol.28, No.2, pp.127-129, 2000. (in Chinese)
    Rigui Zhou, Nan Jiang and Qiulin Ding, “Multi-pattern recognition based on Grover's algorithm”, Chinese Journal of Electronics, Vol.16, No.4, pp.679-682, 2007.
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Article Metrics

    Article views (638) PDF downloads(2128) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return