Research on Secondary Electron Emission Yield Intellectualized Testing System of Space Materials Based on Kingview and PLC

CHANG Tianhai; YIN Peipei

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Article Navigation > Chinese Journal of Electronics > 2014 > 23(3): 635-638

CHANG Tianhai and YIN Peipei, “Research on Secondary Electron Emission Yield Intellectualized Testing System of Space Materials Based on Kingview and PLC,” Chinese Journal of Electronics, vol. 23, no. 3, pp. 635-638, 2014,

Citation:

CHANG Tianhai and YIN Peipei, “Research on Secondary Electron Emission Yield Intellectualized Testing System of Space Materials Based on Kingview and PLC,” Chinese Journal of Electronics, vol. 23, no. 3, pp. 635-638, 2014,

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Research on Secondary Electron Emission Yield Intellectualized Testing System of Space Materials Based on Kingview and PLC

School of Electronic and Information Engineering, South China University of Technology, Guangzhou 510641, China

Funds: This work is supported by the National Natural Science Foundation of China (No.51047002).

Received Date: 2013-01-01
Rev Recd Date: 2013-09-01
Publish Date: 2014-07-05

Abstract

Abstract

This paper describes an intellectualized testing system of the secondary electron emission yield of space materials by combining the technology of electronic control and communication. This system is based on Kingview 6.52 and PLC. The system achieves the document multithreading intellectualized control of vacuum obtaining, pulse modulation of electron gun and on-off of all power sources. The application of Kingview 6.52 makes the design of system more convenient and improves the control quality. The communication with PLC through serial interface improves the ability of data collection and real-time disposing of industry personal computers.
- Secondary electron emission,
- Space materials,
- Programmable logic controller( PLC),
- Kingview

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References(7)

References

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