Citation: | CUI Runlong and CHEN Tao, “EFI System Performance Reliability Evaluation Based on Degradation Data Distribution,” Chinese Journal of Electronics, vol. 27, no. 4, pp. 792-798, 2018, doi: 10.1049/cje.2018.05.012 |
Mamala Jaroslaw, Brol Sebastian and Mariusz Graba, "Engine control unit testing by hardware-in-the-loop simulation", Solid State Phenomena, Vol.214, No.1, pp.67-74, 2014.
|
Nima Gorjian, Lin Ma, Murthy Mittinty, et al., "A review on degradation models in reliability analysis", Proceedings of the 4th World Congress on Engineering Asset Management, Athens, Greece, USA, pp.28-30, 2009.
|
W. Huang and DL Dietrich, "An alternative degradation reliability modeling approach using maximum likelihood estimation", IEEE Transactions on Reliability, Vol.54, No.2, pp.310-317, 2005.
|
G.X. Sun, et al., "A stochastic degradation modeling based adaptive prognostic approach for equipment", Chinese Journal of Electronics, Vol.43, No.6, pp.1119-1126, 2015.
|
J.C. Lu and W.Q. Meeker, "Using degradation measures to estimate a time-to-failure distribution", Technometrics, Vol.35, No.2, pp.161-173, 1993.
|
Mu Seong Chang, Jung Hun Shin, Young Ⅱ Kwon, et al., "Reliability estimation of pneumatic cylinders using performance degradation data", International Journal of Precision Engineering and Manufacturing, Vol.14, No.12, pp.2081-2086, 2013.
|
Chien-Yu Peng and Sheng-Tsaing Tseng, "Progressive-stress accelerated degradation test for highly-reliable products", IEEE Transactions on Reliability, Vol.59, No.1, pp.30-37, 2010.
|
Laidler, Keith, "The development of the Arrhenius equation", Journal of Chemical Education, Vol.61, No.6, pp.494-498, 1984.
|
Min-Te Chao, "Degradation analysis and related topics:Some thoughts and a review", Proceedings of the National Science Council, Part A, Vol.23, No.5, pp.555-566, 1999.
|
José R. Celaya, Abhinav Saxena and Chetan S. Kulkarni, "Prognostics approach for power MOSFET under thermal-stress aging", Proceedings of Reliability and Maintainability Symposium (RAMS), Reno, NV, Jan., pp.1-6, 2012.
|
J.Y. Cai, "Research on analysis and assessment of systemic performance reliability for electronic equipment", Ph.D. Thesis, Nanjing University of Science & Technolog, China, 2010. (in Chinese)
|
S.L. Zhang, et al., "Variable selection in logistic regression model", Chinese Journal of Electronics, Vol.24, No.4, pp.813-817, 2015.
|