WANG Ziren, GAO Jinchun, JI Rui, BILAL Hafiz Muhammad. Investigations on the Effect of Electrical Contact Degradation on High Speed Wide-Band Signal Integrity[J]. Chinese Journal of Electronics, 2020, 29(3): 525-532. doi: 10.1049/cje.2020.03.007
Citation: WANG Ziren, GAO Jinchun, JI Rui, BILAL Hafiz Muhammad. Investigations on the Effect of Electrical Contact Degradation on High Speed Wide-Band Signal Integrity[J]. Chinese Journal of Electronics, 2020, 29(3): 525-532. doi: 10.1049/cje.2020.03.007

Investigations on the Effect of Electrical Contact Degradation on High Speed Wide-Band Signal Integrity

doi: 10.1049/cje.2020.03.007
Funds:  This work was supported by the National Natural Science Foundation of China (No.51877010), Open Fund of State Key Laboratory of Information Photonics and Optical Communications (BUPT), the BUPT Excellent Ph.D. Students Foundation (No.CX2019121), and the Fundamental Research Funds for the Central Universities, BUPT (No.2019PTB-014).
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  • Corresponding author: GAO Jinchun (Corresponding author) received the Ph.D. degree in electronic circuits and systems from the Beijing University of Posts and Telecommunications. She is currently a professor of Electronic Engineering at Beijing University of Posts and Telecommunications. Her research interests include electrical contact reliability and wireless communications. (Email:gjc@bupt.edu.cn)
  • Received Date: 2018-11-14
  • Rev Recd Date: 2019-08-06
  • Publish Date: 2020-05-10
  • Electrical contact degradation will affect the signal integrity resulting in poor communication performance. In the present work, the effect of electrical contact degradation on wide-band digital signal integrity was studied using both the theoretical analysis and experimental testing. The characteristics of digital signals with rise times of 200ps, 400ps, 600ps and 800ps through connectors with different degradation levels were studied. The maximum bandwidth of these signals can reach up to 1.75GHz. An equivalent model of the connector with degraded contact surface was developed and the experimental results are consistent with the model results approximately. The influence of capacitance characteristics caused by degraded contact surface on digital signal waveform was calculated and analyzed. The results of this paper are helpful in developing a better understanding of the characteristics of wide-band digital signal waveforms through the degraded contact surface and provide a theoretical support to identify failure features in fault diagnosis.
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