Volume 30 Issue 2
Apr.  2021
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PENG Zhenzhen and SU Donglin, “Analytical Models of Passive Linear Structures in Printed Circuit Boards,” Chinese Journal of Electronics, vol. 30, no. 2, pp. 275-281, 2021, doi: 10.1049/cje.2020.08.017
Citation: PENG Zhenzhen and SU Donglin, “Analytical Models of Passive Linear Structures in Printed Circuit Boards,” Chinese Journal of Electronics, vol. 30, no. 2, pp. 275-281, 2021, doi: 10.1049/cje.2020.08.017

Analytical Models of Passive Linear Structures in Printed Circuit Boards

doi: 10.1049/cje.2020.08.017
Funds:

the National Natural Science Foundation of China 61427803

the National Natural Science Foundation of China 61771032

the Civil Aircraft Projects of China MJ-2017-F-11

More Information
  • Author Bio:

    PENG Zhenzhen   received the B.S. degree in communication engineering from Harbin Engineering University, Harbin, China, in 2015. She is currently pursuing the Ph.D. degree at Beihang University, Beijing, China. Her current research interests include physics based modeling of circuit-domain, equivalent circuit modeling for signal integrity and electromagnetic compatibility problems. (Email: by1502167@buaa.edu.cn)

  • Corresponding author: SU Donglin   (corresponding author) received the B.S., M.S., and Ph.D. degrees in electrical engineering from Beihang University (BUAA), Beijing, China, in 1983, 1986, and 1999, respectively. In 1986, she joined the Faculty of School of Electronics and Information Engineering, BUAA, where she was first an Assistant, then a Lecturer, later on an Associate Professor, and is currently a Full Professor. Her research interests include the numerical methods for microwave and millimeter-wave integrated circuits and systematic electromagnetic compatibility design of various aircrafts. (Email: sdl@buaa.edu.cn)
  • Received Date: 2020-08-20
  • Accepted Date: 2020-08-28
  • Publish Date: 2021-03-01
  • Analytical models for passive linear structures, like metallic traces, vias, are proposed for simulations at the package and Printed circuit board (PCB) levels. In the proposed method, traces are modeled based on the transmission line theory, whereas the vias are described by the parallel-plate impedance and several equivalent circuits elements. The proposed models can be applied to efficiently simulate composed passive linear structures. Several scenarios are analyzed including traces with two or three width, traces routed into different layers and interconnects commonly used in PCBs. The results of the models are compared with those from the fullwave simulations and experiments. An improvement on the computation speed has been observed with respect to the full-wave simulations at the effective range of models. In our measurements, a compensation approach of impedance mismatch in parameter measurements is analyzed and calculated, which could significantly simplify the experimental process.
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  • [1]
    Z.R. Wang, J.C. Gao, R. Ji, et al., "Investigations on the effect of electrical contact degradation on high speed wide-Band signal integrity", Chinese Journal of Electronics, Vol. 29, No. 3, pp. 525–532, 2020. doi: 10.1049/cje.2020.03.007
    [2]
    V. Stojanovic and M. Horowitz, "Modeling and analyst is of high-speed links", Proceeding of IEEE Custom Integrated Circuits Conference, San Jose, CA, USA, pp. 589–594, 2003.
    [3]
    B. Archambeault and A.E. Ruehli, "Analysis of power/ground-plane EMI decoupling performance using the partial-element equivalent circuit technique", IEEE Transactions on Electromagnetic Compatibility, Vol. 43, No. 4, pp. 437–445, 2001. doi: 10.1109/15.974623
    [4]
    L. Tsang, H. Chen, C.C. Huang, et al., "Modeling of multiple scattering among vias in planar waveguides using Foldy–Lax equations", Microwave and Optical Technology Letters, Vol. 31, No. 4, pp. 375–384, 2004. doi: 10.1002/mop.1398
    [5]
    A.E. Engin, K. Bharath and M. Swaminathan, et al, "Finite-difference modeling of noise coupling between power/ground planes in multilayered packages and boards", Proceeding 56th Electronic Components and Technology Conference, pp. 1262–1267, 2006. http://ieeexplore.ieee.org/document/1645815/references
    [6]
    N. Na, J. Jinseong and S. Chun, et al., "Modeling and transient simulation of planes in electronic packages", IEEE Transactions on Advanced Packaging, Vol. 23, No. 3, pp. 340–352, 2000. doi: 10.1109/6040.861546
    [7]
    R. Ito, R.W. Jackson and T. Hongsmatip, "Modelling of interconnections and isolation within a multilayered ball grid array package", IEEE Transactions on Microwave Theory and Techniques, Vol. 47, No. 9, pp. 1819–1825, 1999. doi: 10.1109/22.788517
    [8]
    Z.Z. Oo, E.X. Liu, E.P. Li, et al., "A semi-analytical approach for system-level electrical modeling of electronic packages with large number of vias", IEEE Transactions on Advanced Packaging, Vol. 31, No. 2, pp. 267–274, 2008. doi: 10.1109/TADVP.2008.923379
    [9]
    X.C. Wei, E.P. Li, E.X. Liu, et al., "Efficient simulation of power distribution network by using integral-equation and modal- decoupling technology", IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 10, pp. 2277–2285, 2008. doi: 10.1109/TMTT.2008.2004257
    [10]
    X.Y. Liu, Y.Y. An, B.G. Yu, et al., "Analysis of commonly and specifically dysregulated pathways in three women cancers", Chinese Journal of Electronics, Vol. 27, No. 5, pp. 1043–1049, 2018. doi: 10.1049/cje.2017.09.028
    [11]
    C. Schuster, Y.H. Kwark, G. Selli, et al., "Developing a physical model for vias", Proceeding of IEC Designcon Conference, Santa Clara, CA, pp. 1–24, 2006.
    [12]
    G. Selli, C. Schuster, Y. Kwark, et al., "Model-to-hardware correlation of physics based via models with the parallel plate impedance included", Proceeding of IEEE Electromagnetic Compatibility Symposium, Portland, OR, pp. 781-785, 2006.
    [13]
    C. Schuster, G. Selli, Y.H. Kwark, et al., "Accuracy and application of physics-based circuit models for vias", Proceeding of IMAPS 39th International Microelectronics Symposium, San Diego, CA, pp. 1–7, 2006.
    [14]
    C. Schuster, G. Selli, Y.H. Kwark, et al., "Progress in representation and validation of physics-based via models", Proceeding of 11th IEEE Signal Propagation on Interconnects Workshop, Genova, Italy, pp. 145–148, 2007.
    [15]
    R. Rimolo-Donadio, A.J. Stepan, H.D. Brüns, et al., "Simulation of via interconnects using physics-based models and microwave network parameters", Proceeding of 12th IEEE Signal Propagation on Interconnects Workshop, Avignon, France, pp. 1–4, 2008.
    [16]
    R. Rimolo-Donadio, H.D. Brüns and C. Schuster, "Including stripline connections into network parameter based via models for fast simulation of interconnects", Proceeding of 20th International Electromagnetic Compatibility Symposium, Zurich, Switzerland, pp. 345–348, 2009.
    [17]
    A.E. Engin, W. John, G. Sommer, et al., "Modeling of striplines between a power and a ground plane", IEEE Transactions on Advanced Packaging, Vol. 29, No. 3, pp. 415–426, 2006. doi: 10.1109/TADVP.2006.872998
    [18]
    Q. Gu, E. Yang and M.A. Tassoudji, "Modeling and analysis of vias in multilayered integrated circuits", IEEE Transactions on Microwave Theory and Techniques, Vol. 41, No. 2, pp. 206–214, 1993. doi: 10.1109/22.216458
    [19]
    Q. Gu, A. Tassoudji, S.Y. Poh, et al., "Coupled noise analysis for adjacent vias in multilayered digital circuits", IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications, Vol. 41, No. 12, pp. 796–804, 1994. doi: 10.1109/81.340842
    [20]
    G.T. Lei, R.W. Techentin, P.R. Hayes, et al., "Wave model solution to the ground/power plane noise problem", IEEE Transactions on Instrumentation and Measurement, Vol. 44, No. 2, pp. 300–303, 1995. doi: 10.1109/19.377836
    [21]
    J.C. Parker, "Via coupling within parallel rectangular planes", IEEE Transactions on Electromagnetic Compatibility, Vol. 39, No. 1, pp. 17–23, 1997. doi: 10.1109/15.554691
    [22]
    Z.L. Wang, O. Wada, Y. Toyota, et al., "Analysis of resonance characteristics of a power bus with rectangle and triangle elements in multilayer PCBs", Proceeding of Asia-Pacific Environmental Electromagnetics Conference, Hangzhou, China, pp. 73–76, 2003.
    [23]
    Z.L. Wang, O. Wada, Y. Toyota, et al., "Convergence acceleration and accuracy improvement in power bus impedance calculation with a fast algorithm using cavity modes", IEEE Transactions on Electromagnetic Compatibility, Vol. 47, No. 1, pp. 2–8, 2005. doi: 10.1109/TEMC.2004.842205
    [24]
    M. Hampe, V. Palanisamy and S. Dickmann, "Single summation expression for the impedance of rectangular PCB power-bus structures loaded with multiple lumped elements", IEEE Transactions on Electromagnetic Compatibility, Vol. 49, No. 1, pp. 58–67, 2007. doi: 10.1109/TEMC.2006.888188
    [25]
    Y. Zhang, J. Fan, G. Selli, et al., "Analytical evaluation of via-plate capacitance for multilayer printed circuit boards and packages", IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 9, pp. 2118–2128, 2008. doi: 10.1109/TMTT.2008.2002237
    [26]
    K. Fu, J. Zheng, W.S. Zhao, et al., "Analysis of transmission characteristics of Copper/Carbon nanotube composite through-silicon via interconnects", Chinese Journal of Electronics, Vol. 28, No. 5, pp. 920–924, 2019. doi: 10.1049/cje.2019.06.005
    [27]
    Z. Wang, G. Dong, Y. Yang, et al., "Crosstalk Noise Voltage of Coupling RC Interconnects with Temperature Distribution", Chinese Journal of Electronics, Vol. 19, No. 1, pp. 43–47, 2010. http://www.ejournal.org.cn/Jweb_cje/EN/abstract/abstract5134.shtml
    [28]
    A.P. Duffy, A.J. Martin, A. Orlandi, et al., "Feature selective validation for validation of computational electromagnetics. Part Ⅰ—The FSV method", IEEE Transactions on Electromagnetic Compatibility, Vol. 48, No. 3, pp. 449–459, 2006. doi: 10.1109/TEMC.2006.879358
    [29]
    X. Chang, C. Schuster, X. Gu, et al., "Eliminating via plane coupling using ground vias for high-speed signal transitions", Proceeding of Electrical Performance of Electronic Packaging, San Jose, CA, USA, pp. 247–250, 2008
    [30]
    T. Kushta, K. Narita, T. Kaneko, et al., "Resonance stub effect in a transition from a through via hole to a stripline in mul- tilayer PCBs", IEEE Microwave and Wireless Components Letters, Vol. 13, No. 5, pp. 169–171, 2003. doi: 10.1109/LMWC.2003.811678
    [31]
    Y. Zhang, J. Fan, G. Selli, et al., "Analytical evaluation of via-plate capacitance for multilayer printed circuit boards and packages", IEEE Transactions on Microwave Theory and Techniques, Vol. 56, No. 9, pp. 2118–2128, 2008. doi: 10.1109/TMTT.2008.2002237
    [32]
    X. Duan, R. Rimolo-Donadio, S. Muller, et al., "Impact of multiple scattering on passivity of equivalent-circuit via models", Proceeding IEEE Electrical Design of Advanced Packaging and Systems Symposium, Hangzhou, China, pp. 12–14, 2011
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