Volume 30 Issue 5
Sep.  2021
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YU Xin, LU Wu, LI Xiaolong, et al., “Total Ionizing Dose Effect and Failure Mechanism of Digital Signal Processor,” Chinese Journal of Electronics, vol. 30, no. 5, pp. 986-990, 2021, doi: 10.1049/cje.2021.07.010
Citation: YU Xin, LU Wu, LI Xiaolong, et al., “Total Ionizing Dose Effect and Failure Mechanism of Digital Signal Processor,” Chinese Journal of Electronics, vol. 30, no. 5, pp. 986-990, 2021, doi: 10.1049/cje.2021.07.010

Total Ionizing Dose Effect and Failure Mechanism of Digital Signal Processor

doi: 10.1049/cje.2021.07.010

This work is supported by the West Light Foundation of Chinese Academy of Science (No.2019-XBQNXZ-B-014).

  • Received Date: 2019-03-27
    Available Online: 2021-09-02
  • Ionizing radiation effect and failure mechanism of Digital signal processor (DSP) is studied through test-board and automatic test equipment to find the relationship between system function failure and parameter degradation. Static bias is more sensitive than dynamic bias when DSP is tested on-line during radiation. Core current, high-Z leakage current and timing parameter are sensitive to ionizing radiation. No enhanced low-dose-rate sensitivity is found by comparing experiment results under high and low dose rate radiation. External memory interface and Timer are deduced to be the sensitive module by step radiation and analysis basing full parameter test in Verigy 93000. The timing parameter degradation have a strong correlation to these module functions. And the degeneration mechanism is analysed on inverter through Hspice simulation which indicate the leakage circuit caused by radiation can lead a delay to the digital signal propagating. The parasitical capacitance among long connections make it worse to the data transmission around DSP, field programmable gate array and memory. Then an early function failure occurs in test board than Verigy 93000. This work provide support to systematic radiation hardness design and hardness assurance/lot acceptance testing in space applications.
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  • E. Holmann, I. R. Linscott, M. J. Maurer, et al., "Fault tolerant, radiation hard, high performance digital signal processor (for spacecraft receiver)", Proc. of the 9th IEEE/AIAA/NASA Conference on Digital Avionics Systems, Virginia Beach, Virginia, USA, pp.468-473, 1990.
    J. D. Kinnison, R. H. Maurer, B. G. Carkhuff, et al., "Radiation characterization of the ADSP2100A digital signal processor", IEEE Transactions on Nuclear Science, Vol.38, No.6, pp.1398-1402, 1991.
    S. H. Crain, R. Velazco, M. T. Alvarez, et al., "Radiation effects in a fixed-point digital signal processor", Proc. of the IEEE Nuclear Space Radiation Effects Conference, Norfolk Beach, Virginia, USA, pp.30-34, 1999.
    B. Sawamura and K. Radke, "Future manned systems advanced avionics study COTS for space", Proc. of the IEEE/AIAA 11th Digital Avionics Systems Conference, Seattle, Washington, USA, pp.514-522, 1992.
    S. Sampson, S. Ramaswamy, C. Alcorn, et al., "Radiation tolerant digital signal processor transformation", Proc. of the 1999 IEEE Aerospace Conference, Manhattan Beach, California, USA, pp.263-272, 1999.
    S. Sampson, P. Duggan, R. Burnell, et al., "Foreign comparative test of space qualified digital signal processors", Proc. of the 2002 IEEE Aerospace Conference, Big Sky, Montana, USA, pp.5, 2002.
    K. F. Xing, Y. K. Wang and X. Hu, "Total ionizing dose effects test of domastic high quality device YHFT-DSP", Semiconductor Technology, Vol.31, No.7, pp.493-505, 2006.
    Z. H. Jia, H. W. Xiang, Z. B. Cai, et al., "Test and analysis for total ionizing dose of COTS ADSP-21060L", Journal of Astronautics, Vol.28, No.3, pp.757-761, 2007.
    X. Zhang, "A research of total dose effect of DSP with circuitlevel simulation", MA.Eng.Thesis, University of Harbin Institute of Technology, China, 2017.
    W. R. Simpson and J. W. Sheppard, "The impact of commercial off-the-shelf (COTS) equipment on system test and diagnosis", Proc. of the Proceedings of IEEE International Test Conference, Baltimore, Maryland, USA, pp.30-36, 1993.
    J. A. Caruso, "The challenge of the increased use of COTs:a developer's perspective", Proc. of the Third Workshop on Parallel and Distributed Real-Time Systems, Santa Barbara, California, USA, pp.155-159, 1995.
    S. C. Witczak, R. C. Lacoe, J. V. Osborn, et al., "Dose-rate sensitivity of modern nMOSFETs", IEEE Transactions on Nuclear Science, Vol.52, No.6, pp.2602-2608, 2005.
    M. R. Shaneyfelt, P. E. Dodd, B. L. Draper, et al., "Challenges in hardening technologies using shallow-trench isolation", IEEE Transactions on Nuclear Science, Vol.45, No.6, pp.2584-2592, 1998.
    H. J. Barnaby, "Total-ionizing-dose effects in modern CMOS technologies", IEEE Transactions on Nuclear Science, Vol.53, No.6, pp.3103-3121, 2006.
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