Citation: | YU Xin, LU Wu, LI Xiaolong, et al., “Total Ionizing Dose Effect and Failure Mechanism of Digital Signal Processor,” Chinese Journal of Electronics, vol. 30, no. 5, pp. 986-990, 2021, doi: 10.1049/cje.2021.07.010 |
E. Holmann, I. R. Linscott, M. J. Maurer, et al., "Fault tolerant, radiation hard, high performance digital signal processor (for spacecraft receiver)", Proc. of the 9th IEEE/AIAA/NASA Conference on Digital Avionics Systems, Virginia Beach, Virginia, USA, pp.468-473, 1990.
|
J. D. Kinnison, R. H. Maurer, B. G. Carkhuff, et al., "Radiation characterization of the ADSP2100A digital signal processor", IEEE Transactions on Nuclear Science, Vol.38, No.6, pp.1398-1402, 1991.
|
S. H. Crain, R. Velazco, M. T. Alvarez, et al., "Radiation effects in a fixed-point digital signal processor", Proc. of the IEEE Nuclear Space Radiation Effects Conference, Norfolk Beach, Virginia, USA, pp.30-34, 1999.
|
B. Sawamura and K. Radke, "Future manned systems advanced avionics study COTS for space", Proc. of the IEEE/AIAA 11th Digital Avionics Systems Conference, Seattle, Washington, USA, pp.514-522, 1992.
|
S. Sampson, S. Ramaswamy, C. Alcorn, et al., "Radiation tolerant digital signal processor transformation", Proc. of the 1999 IEEE Aerospace Conference, Manhattan Beach, California, USA, pp.263-272, 1999.
|
S. Sampson, P. Duggan, R. Burnell, et al., "Foreign comparative test of space qualified digital signal processors", Proc. of the 2002 IEEE Aerospace Conference, Big Sky, Montana, USA, pp.5, 2002.
|
K. F. Xing, Y. K. Wang and X. Hu, "Total ionizing dose effects test of domastic high quality device YHFT-DSP", Semiconductor Technology, Vol.31, No.7, pp.493-505, 2006.
|
Z. H. Jia, H. W. Xiang, Z. B. Cai, et al., "Test and analysis for total ionizing dose of COTS ADSP-21060L", Journal of Astronautics, Vol.28, No.3, pp.757-761, 2007.
|
X. Zhang, "A research of total dose effect of DSP with circuitlevel simulation", MA.Eng.Thesis, University of Harbin Institute of Technology, China, 2017.
|
W. R. Simpson and J. W. Sheppard, "The impact of commercial off-the-shelf (COTS) equipment on system test and diagnosis", Proc. of the Proceedings of IEEE International Test Conference, Baltimore, Maryland, USA, pp.30-36, 1993.
|
J. A. Caruso, "The challenge of the increased use of COTs:a developer's perspective", Proc. of the Third Workshop on Parallel and Distributed Real-Time Systems, Santa Barbara, California, USA, pp.155-159, 1995.
|
S. C. Witczak, R. C. Lacoe, J. V. Osborn, et al., "Dose-rate sensitivity of modern nMOSFETs", IEEE Transactions on Nuclear Science, Vol.52, No.6, pp.2602-2608, 2005.
|
M. R. Shaneyfelt, P. E. Dodd, B. L. Draper, et al., "Challenges in hardening technologies using shallow-trench isolation", IEEE Transactions on Nuclear Science, Vol.45, No.6, pp.2584-2592, 1998.
|
H. J. Barnaby, "Total-ionizing-dose effects in modern CMOS technologies", IEEE Transactions on Nuclear Science, Vol.53, No.6, pp.3103-3121, 2006.
|