Volume 31 Issue 6
Nov.  2022
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JIA Chunlai, HE Zi, DING Dazhi, et al., “Characteristic Mode Analysis for Thin Dielectric Sheets with Alternative Surface Integral Equation,” Chinese Journal of Electronics, vol. 31, no. 6, pp. 1181-1188, 2022, doi: 10.1049/cje.2022.00.246
Citation: JIA Chunlai, HE Zi, DING Dazhi, et al., “Characteristic Mode Analysis for Thin Dielectric Sheets with Alternative Surface Integral Equation,” Chinese Journal of Electronics, vol. 31, no. 6, pp. 1181-1188, 2022, doi: 10.1049/cje.2022.00.246

Characteristic Mode Analysis for Thin Dielectric Sheets with Alternative Surface Integral Equation

doi: 10.1049/cje.2022.00.246
Funds:  This work was supported by the Natural Science Foundation of China (62235006, 61890541, 62025109, 61890545, 61890540, 61931021)
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  • Author Bio:

    Chunlai JIA received the M.S. degree in power machinery and engineering from the School of Energy Power and Mechanical Engineering, North China Electric Power University, Baoding, China, in 2014. During 2014 to 2018, he was a Power Engineer with Huaneng Shang’an Power Plant, Shijiazhuang, China. He is currently pursuing the Ph.D. degree in electronic science and technology with the Department of Communication Engineering, Nanjing University of Science and Technology, Nanjing, China. His current research interests include computational electromagnetics, antenna, and array optimizations

    Zi HE (corresponding author) received the B.S. and Ph.D. degrees in electronic information engineering from the School of Electrical Engineering and Optical Technique, Nanjing University of Science and Technology, Nanjing, China, in 2011 and 2016, respectively. She has worked as a Visiting Scholar in the University of Illinois at Urbana and Champaign (UIUC) from September 2015 to September 2016. She works as a Postdoctor at the Science and Technology on Electromagnetic Scattering Laboratory, Beijing Institute of Environmental Features. She is an Associate Professor with the Department of Communication Engineering, Nanjing University of Science and Technology. Her research interests include antenna, RF-integrated circuits, and computational electromagnetics. (Email: 15850554055@163.com)

    Dazhi DING received the B.S. and Ph.D. degrees in electromagnetic field and microwave technique from the Nanjing University of Science and Technology (NJUST), Nanjing, China, in 2002 and 2007, respectively. In 2005, he was with the Center of wireless Communication, City University of Hong Kong, Hong Kong, as a Research Assistant. He joined the Department of Electrical Engineering, NJUST, where he became a Lecturer in 2007. In 2014, he was promoted to Full Professor in NJUST, where he was appointed as the Head of the Department of Communication Engineering, in September 2014. He is the author or coauthor of over 30 technical articles. He has authored or coauthored more than 80 articles. His current research interests include computational electromagnetics and electromagnetic scattering and radiation. Dr. Ding was a recipient of the National Excellent Youth Fund by the National Science Foundation of China (NSFC) in 2020

    Ling GUAN was born in Nanjing, China. He received the B. S. degree and Ph.D. degree in communication engineering from the School of Electrical Engineering and Optical Technique, Nanjing University of Science and Technology, Nanjing, China, in 2014 and 2020, respectively. He is now working as a Senior Engineer at the Science and Technology on Electromagnetic Scattering Laboratory, Beijing Institute of Environmental Features. His research interests are computational electromagnetics, EM scattering, and antennas

    Xia AI was born in Yulin, China, in 1986. He received the Ph.D. degree in electromagnetics and microwave technology from Xidian University, Xi’an, China, in 2013. He is currently a Senior Engineer with the National Key Laboratory of Science and Technology on Test Physics and Numerical Mathematics. His research interests include computational electromagnetics, radar target recognition, and electromagnetic scattering characteristic of complex medium

    Jiaqi LIU was born in Yueyang, China, in 1963. He received the Ph.D. degree in circuit and systems from Beihang University, Beijing, China, in 2007. He currently serves as the Vice Director and leading Research Fellow with the National Key Laboratory of Science and Technology on Test Physics and Numerical Mathematics. His research area is signal processing and target recognition

    Xuewen CHEN is Full Professor of physics at the Huazhong Unviersity of Science and Technology. He did his undergraduate study and doctoral work both in Zhejiang University, Hangzhou, China. He carried out postdoctoral research in nano-optics and single-molecule microscopy at the Laboratory for Physical Chemistry at ETH Zurich. From 2011 to 2014, with a brief stint as a Visiting Scholar at Ginzton Lab of Stanford in 2013, he had work as a Research Scientist at the Max-Planck Institute for the Science of Light. In 2014, he joined Huazhong University of Science and Technology as National Scholar (young) and Professor of Physics. His independent research includes theoretical, computational and experimental studies of nano-optics and quantum optics with single quantum systems

  • Received Date: 2022-07-30
  • Accepted Date: 2022-10-31
  • Available Online: 2022-11-12
  • Publish Date: 2022-11-05
  • When the dielectric sheet is electrically thin in the normal direction, the conventional volume integral equation (VIE) can be approximately simplified to the surface one. On this basis, a novel surface integral equation-based formulation is presented for analyzing characteristic mode (CM) of thin dielectric sheets. The resultant CMs are expressed with tangential and normal components of electric volume currents, which are more intuitive than the conventional VIE-based one. Due to the application of volume equivalence principle, the proposed formulation is immune to non-physical modes. The CMs of typical thin dielectric bodies, including the dielectric substrate and radome, are analyzed to show that the proposed formulation is computationally efficient with encouraging accuracy.
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