A Single-Event-Transient Hardened Phase Locked Loop for Clock and Data Recovery

YUAN Hengzhou; LIANG Bin; SANG Hao; XU Weixia; GUO Yang; CHEN Xi

doi:10.23919/cje.2022.00.017

Volume 33 Issue 2

Mar. 2024

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Article Navigation > Chinese Journal of Electronics > 2024 > 33(2): 353-361

Hengzhou YUAN, Bin LIANG, Hao SANG, et al., “A Single-Event-Transient Hardened Phase Locked Loop for Clock and Data Recovery,” Chinese Journal of Electronics, vol. 33, no. 2, pp. 353–361, 2024 doi: 10.23919/cje.2022.00.017

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Hengzhou YUAN, Bin LIANG, Hao SANG, et al., “A Single-Event-Transient Hardened Phase Locked Loop for Clock and Data Recovery,” Chinese Journal of Electronics, vol. 33, no. 2, pp. 353–361, 2024 doi: 10.23919/cje.2022.00.017

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A Single-Event-Transient Hardened Phase Locked Loop for Clock and Data Recovery

doi: 10.23919/cje.2022.00.017

1.
National University of Defense Technology, Changsha 410073, China

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Author Bio:
Hengzhou YUAN was born in Hunan Province. He received the Ph.D. degree in microelectronics and solid state electronics from National University of Defence Technology, China. He is a Lecturer of National University of Defence Technology. His research interests include high speed digital analog mixed integrated circuit design and radiation hardening technology

Bin LIANG was born in Hunan Province. He received the Ph.D. degree in microelectronics and solid state electronics from National University of Defence Technology, China. He is a Professor of National University of Defence Technology. His research interests include integrated Circuit design and radiation hardening mechanism for aerospace applications. (Email: liangbin110@126.com)

Hao SANG was born in Anhui Province. He is a Ph.D. candidate of National University of Defence Technology, China. His research interests include high speed digital-analog mixed integrated circuit design and radiation hardening technology

Weixia XU was born in Hunan Province. He received the Ph.D. degree in microelectronics and solid state electronics from National University of Defence Technology, China. He is a Professor of National University of Defence Technology. His main research interests include computer architecture, high-performance microprocessor design, artificial intelligence, and neuromorphic computation

Yang GUO was born in Zhejiang Province. He received the Ph.D. degree in microelectronics and solid state electronics from National University of Defence Technology, China. He is a Professor of National University of Defence Technology. His research interests include high performance processor architecture and VLSI design. (Email: guoyang@nudt.edu.cn)

Xi CHEN was born in Hubei Province. She received the Ph.D. degree in microelectronics and solid state electronics from National University of Defence Technology, China. She is a Lecturer of Changsha University. Her research interests include high speed digital-analog mixed integrated circuit design and radiation hardening technology. (Email: xi.chen1984@qq.com)
Corresponding author: Email: xi.chen1984@qq.com
Received Date: 2022-01-26
Accepted Date: 2022-07-05

Available Online: 2023-06-28

Publish Date: 2024-03-05

Abstract

Abstract

A radiation-hardened phase-locked loop is proposed for phase interpolator clock and data recovery purposes. A sensitive node-compressed charge pump and multi-node cross coupling voltage-controlled oscillators are proposed in this phase-locked loop with the goal of achieving good jitter performance and improving anti-SET (SET, single-event transient) capability. The root mean square (RMS) jitter of the phase-locked loop is reduced from 3.7 ps to 2.58 ps at 2 GHz, while the laser threshold is improved from 120 pJ to 370 pJ compared to the unhardened phase-locked loop. The hardened phase-locked loop also does not lose its lock state from linear energy transfers (LETs) of 3.3 to 37.3 MeV·cm²/mg.
- Phase-locked loop,
- Clock data recovery,
- Voltage-controlled oscillator,
- Radiation-hardened,
- Charge pump

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References(26)

References

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