Jiangfei Bai, Shunchuan Yang, and Donglin Su, “An Improved Z-buffer Accelerated PO Method for EM Scattering from Electrically Large Targets,” Chinese Journal of Electronics, vol. 34, no. 1, pp. 1–8, 2025. DOI: 10.23919/cje.2024.00.025
Citation: Jiangfei Bai, Shunchuan Yang, and Donglin Su, “An Improved Z-buffer Accelerated PO Method for EM Scattering from Electrically Large Targets,” Chinese Journal of Electronics, vol. 34, no. 1, pp. 1–8, 2025. DOI: 10.23919/cje.2024.00.025

An Improved Z-buffer Accelerated PO Method for EM Scattering from Electrically Large Targets

  • The physical optical (PO) method is widely used to solve the electromagnetic (EM) scattering problems involved electrically large structures, in which each surface element is required to determine whether it is blocked by others. It may suffer from the computational efficiency issue through elementwise shadowing testing. In this paper, an efficient Z-buffer based shadowing testing method is proposed to accelerate this procedure. In the proposed method, all triangular facets are first mapped to a grid plane as the Z-buffer method, and for each grid cell, all projected triangles intersecting it are recorded. Then, rigorous shadowing testing is made for all facets recorded in the grid where the centroid of each triangle is projected. It can avoid a large number of redundant operations for pairs of triangles with no occlusion relation, which lead to the same accuracy as the traditional rigorous shadowing testing method with significantly efficiency improvement. Four numerical examples are carried out to validate its accuracy and efficiency.
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