WANG Zeng, DONG Gang, YANG Yintang, et al., “Crosstalk Noise Voltage of Coupling RCInterconnects with Temperature Distribution,” Chinese Journal of Electronics, vol. 19, no. 1, pp. 43-47, 2010,
Citation:
WANG Zeng, DONG Gang, YANG Yintang, et al., “Crosstalk Noise Voltage of Coupling RCInterconnects with Temperature Distribution,” Chinese Journal of Electronics, vol. 19, no. 1, pp. 43-47, 2010,
WANG Zeng, DONG Gang, YANG Yintang, et al., “Crosstalk Noise Voltage of Coupling RCInterconnects with Temperature Distribution,” Chinese Journal of Electronics, vol. 19, no. 1, pp. 43-47, 2010,
Citation:
WANG Zeng, DONG Gang, YANG Yintang, et al., “Crosstalk Noise Voltage of Coupling RCInterconnects with Temperature Distribution,” Chinese Journal of Electronics, vol. 19, no. 1, pp. 43-47, 2010,
Based on MT (Masao takahashi) crosstalk noise model and the analysis of interconnect tempera- ture e®ect, A temperature-dependent model of intercon- nect crosstalk noise voltage in time domain for genetic RC trees is proposed in this paper. The proposed model ana- lyzes multilevel crosstalk noise voltage in 45nm technology node and takes the temperature distribution into account to gain the accurate estimation of interconnect crosstalk noise voltage. Compared with the previous models, the proposed method has a precise advantage in three noise metrics which are peak noise amplitude, noise pulse width and peak noise occurring time. The proposed method transforms generic RC interconnects with branches into the 2-Q model with the maximum errors being 4.4%, 3.1% and 2.9%, respectively.
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