YAO Xiangjuan, GONG Dunwei, WANG Wenliang. Test Data Generation for Multiple Paths Based on Local Evolution[J]. Chinese Journal of Electronics, 2015, 24(1): 46-51.
Citation: YAO Xiangjuan, GONG Dunwei, WANG Wenliang. Test Data Generation for Multiple Paths Based on Local Evolution[J]. Chinese Journal of Electronics, 2015, 24(1): 46-51.

Test Data Generation for Multiple Paths Based on Local Evolution

Funds:  This work is supported by Natural Science Foundation of China (No.61203304, No.61375067), Natural Science Foundation of Jiangsu Province (No.BK2012566), and the Fundamental Research Funds for the Central Universities (No.2012QNA41).
  • Received Date: 2012-12-01
  • Rev Recd Date: 2014-09-01
  • Publish Date: 2015-01-10
  • Generating test data by genetic algorithms is a promising research direction in software testing, among which path coverage is an important test method. The efficiency of test data generation for multi-path coverage needs to be further improved. We propose a test data generation method for multi-path coverage based on a genetic algorithm with local evolution. The mathematical model is established for all target paths, while in the algorithm the individuals are evolved locally according to different objective functions. We can improve the utilization efficiency of test data. The computation cost can be reduced by using fitness functions of different granularity in different phases of the algorithm.
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