ZHANG Chen, DUAN Zhenhua, YU Bin, TIAN Cong, DING Ming. A Test Case Generation Approach Based on Sequence Diagram and Automata Models[J]. Chinese Journal of Electronics, 2016, 25(2): 234-240. doi: 10.1049/cje.2016.03.007
Citation: ZHANG Chen, DUAN Zhenhua, YU Bin, TIAN Cong, DING Ming. A Test Case Generation Approach Based on Sequence Diagram and Automata Models[J]. Chinese Journal of Electronics, 2016, 25(2): 234-240. doi: 10.1049/cje.2016.03.007

A Test Case Generation Approach Based on Sequence Diagram and Automata Models

doi: 10.1049/cje.2016.03.007
Funds:  This work is supported by the National Natural Science Foundation of China (No.61420106004, No.61322202, No.61303031, No.61272117, No.61202177, No.61133001, No.61172147) and the Fundamental Research Funds for the Central Universities (No.K5051303005).
  • Received Date: 2014-04-23
  • Rev Recd Date: 2014-10-10
  • Publish Date: 2016-03-10
  • To improve the test automation in software development process, following the researches on test cases generation technology from models, an incremental test case generation approach is proposed based on finite automata, and Event deterministic finite automata (ETDFA) are employed to describe the sequence diagram models of system interaction. By model checked with Propositional projection temporal logic (PPTL), the correctness of ETDFA is verified. Then we can get the composed automata by synthesis rules, and generate the test cases incrementally by test cases generation algorithm. Case studies are presented to show that this approach enables to improve test cases correctness, and reduce the complexity of test cases generation process.
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