LI Gang, WANG Pengjun, QIAN Haoyu. Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point[J]. Chinese Journal of Electronics, 2018, 27(4): 873-878. doi: 10.1049/cje.2018.02.011
Citation: LI Gang, WANG Pengjun, QIAN Haoyu. Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point[J]. Chinese Journal of Electronics, 2018, 27(4): 873-878. doi: 10.1049/cje.2018.02.011

Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point

doi: 10.1049/cje.2018.02.011
Funds:  This work is supported by the National Natural Science Foundation of China (No.61474068, No.61274132), the Natural Science Foundation of Zhejiang Provice (No.LQ14F040001), the Project of Department of Education of Zhejiang Provice (No.Y201430798), and the Scientific Research Foundation of Graduate School of Ningbo University and the K.C. Wong Magna Fund in Ningbo University, China.
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  • Corresponding author: WANG Pengjun (corresponding author) was born in 1966. He received the M.S. degree in electronic science and technology from Zhejiang University, and the Ph.D. degree in detection technology and automatic equipment from East China University of Science and Technology. He is a professor in the Institute of Circuits and Systems at Ningbo University. He is now a senior member of Chinese Institute of Electronics and Chinese Computer Federation. His research interests include multi-valued logic circuit, low power integrated circuit design and information security chip design. (Email:wangpengjun@nbu.edu.cn)
  • Received Date: 2016-03-08
  • Rev Recd Date: 2016-05-27
  • Publish Date: 2018-07-10
  • By using processing variations in the unitcircuits of the same structures and design parameters during manufacturing, Physical unclonable function (PUF) generates security keys with characteristic of uniqueness, randomness and unclonability. In this paper, a highly reliable multiport PUF scheme was proposed based on MOSFET Zero temperature coefficient (ZTC) point. It consists of input register, deviation-current generating module, arbiter array and obfuscation circuit. After reconfiguring deviation-current generating module by applying different input challenges, the PUF circuit updates keys without physical replacement. And multi-bit keys can be generated in one clock cycle. In TSMC-LP 65nm CMOS technology, the layout of 64-port reconfigurable PUF occupies 131μm×242μm with custom designing. Experimental results show that the PUF circuit has good statistical characteristic of uniqueness and randomness. It exhibits high reliability of 98.2% with respect to temperature variation from -40℃ to 125℃ and supply voltage variation from 1.08V to 1.32V, indicating that it can be reliably and effectively used in information security field.
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